Past Events

This group training event will focus on the basic theory and operation of the Renishaw Invia Reflex Micro Raman
Users will learn about specifics of the instrument capabilities and strategies for data collection and data quality improvement. Users can bring their own (non-hazardous) samples for this training. We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment. This is usually one session <2hours. Full independent tool access will be granted upon completion of this training session.
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic imaging and operation of the Zeiss SIGMA 300, Zeiss Gemini 450 and Zeiss Merlin SEM's available at Characterization.nano. Users will learn about specifics of the instrument configurations, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use session that will be coordinated with the staff member during this small group training. 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic theory and operation of the Agilent 5100 DVD Inductively Coupled Plasma-Optical Emission Spectrometer 
Users will learn about specifics of the instrument capabilities and strategies for data collection and data quality improvement. This is usually two session <2hours each. During the first session we will run a DEMO samples and we will discuss your sample preparation. For your second session Instructor will assist you run your samples.  Second session will be scheduled at the end of this session. We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment.  Full independent tool access will be granted upon completion of both training sessions.
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic theory and operation of the Perkin Elmer 1050 UVVISNIR Spectrophotometer
Users will learn about specifics of the instrument capabilities and strategies for data collection and data quality improvement. Users can bring their own (non-hazardous) samples for this training. We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment. This is usually one session <2hours. Full independent tool access will be granted upon completion of this training session.
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic theory and operation of the Bruker Dektak DXT-A Stylus Profilometer 
Users will learn about specifics of the instrument capabilities and strategies for data collection and data quality improvement. Users can bring their own (non-hazardous) samples for this training. We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment. This is usually one session <2hours. Full independent tool access will be granted upon completion of this training session.
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

Oxford Instruments Asylum Research AFM & WITec Raman is holding a day-long, in-person workshop with morning presentations (12-0168 ) and afternoon hands-on applications topics (12-0145). Please join us for an informative day on advanced AFM and Raman capabilities at MIT.nano.

WORKSHOP SCHEDULE

9:15 AM – 9:30 AM
Welcome (Coffee and pastries sponsored by Oxford Instruments)

9:30 AM – 10:30 AM
What can I measure with an Atomic Force Microscope? Advanced AFM modes for materials characterization
Ted Limpoco, Ph.D., Senior Applications Scientist, Oxford Instruments Asylum Research

10:30 AM – 11:30 AM
Molecular visualization of 2D materials with correlative microscopy
Ute Schmidt, Applications Manager, WITec Raman

11:30 AM – 12:30 PM
Raman spectroscopy of cementitious materials
Admir Mašić, Associate Professor of Civil and Environmental Engineering, MIT

12:30 PM – 1:30 PM
Lunch sponsored by Oxford Instruments

1:30 PM – 2:00 PM
Atomic Force Microscopy of 2D materials
Ted Limpoco, Ph.D., Senior Applications Scientist, Oxford Instruments Asylum Research

2:00 PM – 5:00 PM
Afternoon hands-on workshop for most common applications using the Cypher VRS AFM and WITec Raman at MIT.nano (Location: 12-0195).

TALK DETAILS

LOCATION: 12-0168
TIME: 9:30 AM - 10:30 AM

TITLE: What can I measure with an Atomic Force Microscope? Advanced AFM modes for materials characterization
SPEAKER: Ted Limpoco, Ph.D., Senior Applications Scientist, Oxford Instruments Asylum Research

Atomic force microscopes (AFMs) are fundamentally visualization tools with the ability to routinely resolve topographic features of surfaces at the nanometer scale. At its highest performance, AFMs can resolve even atomic lattices and point defects. AFMs also use a mechanical probe, such that it essentially “touches” the surface, so we can obtain more information than just topography. Contact or proximity to the surface enable us to measure material properties, such as mechanical, electrical, and magnetic properties. Since the probe tip is very small, we can get very local information, mapping this on surface topography with nanometer detail. AFMs have thus become an indispensable tool in nanotechnology research.

In this presentation, we will survey advanced AFM modes that measure properties such as Young’s modulus, adhesion, and viscoelastic response (force curves, FFM, AMFM, DART-CR); current (CAFM); surface potential and work function (KPFM or SKPM); electric charge and magnetic field (EFM and MFM); capacitance, as well as dopant levels and type (SCM); and, finally, electromechanical or piezoelectric response (DART™-PFM). In the process, we will touch on advances in multi-frequency modes (DART™, AM-FM), modern methods of cantilever excitation (blueDrive™ photothermal excitation), capturing biomolecular dynamics (video-rate scanning), and imaging under environmental control.

We will highlight capabilities of Asylum Research AMF tools available at MIT.nano, such as the Cypher VRS and Jupiter XR. In addition, we'll introduce Vero AFM featuring quadrature phase differential interferometric (QPDI™) technology.

These various measurement modes, combined with its ultrahigh resolution, highlight the strength and versatility of AFMs in materials characterization and nanotechnology research.

TIME: 10:30 AM - 11:30 AM

TITLE: Molecular visualization of 2D materials with correlative microscopy
SPEAKER: Ute Schmidt, Applications Manager, WITec Raman

The great success of graphene [1] kicked off the rapid growth in research on materials consisting of only one or a few layers of atoms, defined as 2D materials. In addition to graphene, other 2D materials such as transition metal dichalogenides (TMDs) have attracted increasingly attention due to their remarkable electronic and optical properties. Graphene [1,2] and TMDs [3,4] have a layered structure in common and experience significant changes in their properties with layer thickness, making them very attractive materials for electronics design [5]. For applied research and their integration with electronic circuits and sensors, the quality of the 2D materials is of great interest in terms of defects such as wrinkles, folding or lattice mismatches [6-8]. Importantly, the optical and electronic properties of 2D materials are strongly influenced by the stacking disorder [9]. 

The characterization tool of choice for these types of 2D materials should be non-destructive, fast, with high resolution and capable of providing comprehensive structural, optical and electronic information. This implies the combination of more than one characterization techniques to obtain a thorough understanding of their attributes for specific applications.

This talk provides insight into how optical spectroscopic imaging (Raman/Photoluminescence/SHG) in combination with AFM, contributes to an comprehensive characterization of such 2D materials. 

REFERENCES

1. K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, Y. Zhang, S. V. Dubonos, I. V. Grigorieva and A. A. Firsov, Science 306 (2004) 666.
2. Geim A. K., Grigorieva I. V., Nature 499 (2013) 419.
3. M. Xu, T. Liang, M. Shi and H. Chen, Chem. Rev. 113 (2013) 3766 
4. J.A. Wilson & A.D. Yoffe , Advances in Physics, 18-73 (1969)193.
5. Koppens F. H. L., Nueller T., Avouris P., Ferrari A.C., Vitiello M. S., Polini M., M. Nat. Nano 9 (2014) 780.
6. You Y., Ni Z., Yu T., Shen Z., Appl. Phys. Letters 93 (2008) 1.
7. T. Ohta, T. Becheem, J.T. Robinson, G.L. Kellogg, Phys. Rev B 85 (2012) 75415.
8.  S. D. Costa, J. E. Weis, O. Frank, M. Kalbac, Carbon 98 (2016) 592.
9. Y. Chen, L. Meng, W. Zhao, Z. Liang, X. Wu, H. Nan, Z. Wu, S. Huang, L. Sun, J. Wang, and Z. Ni, Phys. Chem. Chem. Phys. 16 (2014) 21682.

This group training event will focus on the basic imaging and operation of the Zeiss SIGMA 300, Zeiss Gemini 450 and Zeiss Merlin SEM's available at Characterization.nano. Users will learn about specifics of the instrument configurations, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use session that will be coordinated with the staff member during this small group training. 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

The Wet Chemical Process Training provides an introduction for all work with liquid chemicals in Fab.nano. Completion is required for any use of fume hoods or wet benches (including solvents, hands-on training for spin coaters, corrosive hoods and wet benches).

The training is also a prerequisite for 24-hour access to the Fab.nano facility, as it provides the relevant safety foundations.

This group training event will focus on the basic theory and operation of the Fourier Transform Infrared Spectrometer 
Users will learn about specifics of the instrument configurations, available accessories and strategies for data collection and data quality improvement. Users can bring their own (non-hazardous) samples for this training in whatever form is convenient. We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment. This is usually one session <2hours. Full independent tool access will be granted upon completion of this training session.
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic imaging and operation of the Zeiss SIGMA HD VP available at Characterization.nano. Users will learn about specifics of the instrument configurations, different imaging detectors available and strategies for image quality improvement. We'll use standard sample for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff me. 

Active MIT.nano user account  (MUMMS) is required to participate in this training. Please setup an account prior to registering for the training event.