The Icon XR has many SPM modes including contact and PeakForce tapping mode with ScanAsyst, Magnetic Force Microscopy, Piezo Force Microscopy, conducting atomic force microscopy (AFM). There are also additional features such as electrical characterization from 80 fA to 1 uA with 10 nm spatial resolution, Kelvin Force Probe Microscopy with amplitude or frequency feedback, and pixel-by-pixel quantitative force characterization to probe material properties.
Related Tools
Asylum Research Jupiter XR AFM
Asylum Research Cypher VRS AFM
Agilent 5500 AFM
Staff/Contact
Alan Schwartzman, PhD
9-114
60 Vassar Street (rear)
Cambridge, MA
Rami Dana, PhD
12-0195
ASSISTED USE / TRAINING REQUEST
Location
12-0195
60 Vassar Street (rear)
Cambridge, MA